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Basic Contact Mode Operation

This section outlines the basic operational procedures involved in obtaining data in Contact Mode.

Probe Requirements:

The 100 μm wide-legged cantilever on the SiN substrate is the first choice for Contact mode imaging of most samples. If the image degrades rapidly because the tip damages the sample surface, switch to a cantilever with a lower spring constant. Refer to the Probe Selection and Handling for more detailed information.

Steps to acquiring Contact Mode images:

  1. Set Up the Experiment
  2. Scanner, Probe, and Sample Preparation
  3. Locate the Probe Tip
  4. Focus Surface
  5. Check Initial Scan Parameters
  6. Engage and Scan

 

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